LECI provides the A-Zoom Micro Probing Microscope from Excelitas Technologies, an analytical probing microscope system featuring a specialized single-objective design...
LECI provides the A-Zoom Micro Probing Microscope from Excelitas Technologies, an analytical probing microscope system featuring a specialized single-objective design for high-precision wafer inspection and imaging applications.
Its compact single-objective architecture eliminates the need for complex rotating nose-turret mechanisms, helping optimize operation efficiency and improve wafer probing throughput in semiconductor and microelectronics inspection systems.
The A-Zoomµ Micro represents the latest addition to the time-tested line of A-Zoom probing microscopes. Designed for streamlined operation and compact integration onto a multitude of probing stations, the A-Zoomµ Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features, function or performance.
Compatible with a variety of prober stations, A-Zoom Micro offers a high-value solution for circuit board, semiconductor and flat-panel display probing without sacrificing features or performance.
Contact infomation:
LECI Co., Ltd
Room 1901, Saigon Trade Center, No. 37 Ton Duc Thang Street, Saigon Ward, Ho Chi Minh City, Vietnam
7:1 parfocal optical zoom 2X quick-slider extends magnification to 14:1 Compact design affords exceptional imaging value and economy for manual probe stations Compatible with full range of Optem LWD objective lenses Ergonomic features include tilting or fixed 10X eyepieces and one-hand magnification adjustment Variety of trinocular and photoport head options offer camera integration flexibility Integrated 10-Watt LED coaxial illumination for bright and uniform target illumination Precision focus block offers 50 mm travel to establish fine-focus and provide a stable mounting interface for most any probe station
