Microfocus X-ray Source is an X-ray source specifically designed to generate X-rays from an extremely small focal spot, minimizing image blur during geometric magnification and enabling high-resolution X-ray imaging. This technology is widely used in 2D and 3D non-destructive testing (NDT) and industrial computed tomography (CT).
The focal spot size directly affects geometric unsharpness. The smaller the focal spot, the lower the image blur at high magnification, resulting in sharper edges and improved visibility of fine internal structures.
Microfocus X-ray sources are therefore particularly suitable for inspecting very small defects and internal structures, including BGA/QFN solder joints, voids, PCB and electronic components, semiconductor devices, metal and plastic parts, and internal material structures. According to Hamamatsu, achieving high-resolution X-ray images depends not only on a small focal spot, but also on geometric magnification and detector resolution.
Contact infomation:
LECI Co., Ltd
Room 1901, Saigon Trade Center, No. 37 Ton Duc Thang Street, Saigon Ward, Ho Chi Minh City, Vietnam
Long Bien, Ha Noi, VN.
Phone: (+84) 901442689 (WhatsApp)
Hotline: 02822202988
Website: lecilaser.com
